FLUX: Finding Bugs with LLVM IR Based Unit Test Crossovers
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by Eric Liu, Shengjie Xu and David Lie
Reference:
Eric Liu, Shengjie Xu and David Lie, “FLUX: Finding Bugs with LLVM IR Based Unit Test Crossovers”, In Proceedings of the 38th IEEE/ACM International Conference on Automated Software Engineering (ASE), 2023.
Bibtex Entry:
@string{ase23="Proceedings of the 38th IEEE/ACM International Conference on Automated Software Engineering (ASE)"}
@inproceedings{eliu:ase2023:flux,
author = {Eric Liu and Shengjie Xu and David Lie},
title = {{FLUX}: Finding Bugs with {LLVM} {IR} Based Unit Test Crossovers},
booktitle = ASE23,
year = {2023},
month = sep,
note = {(Acceptance: 131/629, 21\%)},
url = {https://security.csl.toronto.edu/wp-content/uploads/2023/09/eliu-ase2023-flux.pdf},
}